2022 차세대 리소그래피 학술대회

2022 Next Generation Lithography Conference

The Next Decade Visioning for Lithography

Aug. 17 (Wed.) ~ 18 (Thu.), 2022
Suwon Convention Center, Suwon-si, Gyeonggi-do, Korea
Accompanying Event: ASML TechTalk [Aug. 19 (Fri.), 2022]
Session Track
Program at a Glance
PS6
Patterning Materials

PS6-01
Synthesis and photolithography of perfluoroalkylated photoresist based on tin oxide with high etching resistance for EUVL
안형주, *이진균 (인하대학교)
PS6-02
Possibility of perfluoroalkylated metallophthalocyanine as EUV resist 
최민규, *이진균 (인하대학교)
PS6-03
Characterization of electrode patterns fabricated by using plating method for flexible printed circuit boards
*Sung-Jei Hong, Chul Jong Han (Korea Electronics Technology Institute), Hyontae Kim (PRO 2000 co., Ltd.), Jeong Beom Park, Sang Hyeok Hong, Ajin Jo (Korea Electronics Technology Institute)
PS6-04
Metal oxide nanoparticle inks: unconventional patterning materials
Hojun Kim, Phuoc Loc Truong, Phuong-Danh Bui, Gichan Kim, *Daeho Lee (Gachon University)
PS6-05
Area-Selective Deposition of oxide thin films for nano-patterning
Jieun Kim, *Jung Wook Lim, *Sung-Hoon Hong (Electronics and Telecommunications Research Institute, University of Science and Technology)
PS6-06
Synthesis and characterization of hydrogen silsesquioxane/tin oxo cluster blend material for EUV photoresist 
Jiyoung Bang, Hyeok Yun, Wonchul Kee (전남대학교), Siwoo Noh, Ki-Jeong Kim (Pohang Accelerator Laboratory, POSTECH), *Hyun-Dam Jeong (전남대학교)
PS6-07
An effective method for the fabrication of perfect optical Fourier elements
임용준, 김광진, 백동재, 손희주, 홍승재, 방준하, *이승우 (Korea University)
PS6-08
A Newly Synthesized Tin Oxo Cluster for Extreme Ultraviolet (EUV) Photoresist
Hyeok Yun, Jiyoung Bang (Chonnam national university), Siwoo Noh, Geonhwa Kim, Ki-Jeong Kim (Pohang Accelerator Laboratory), *Hyun-Dam Jeong (Chonnam national university)
PS6-09
Newly Synthesized Tin Oxo Cluster Resist for EUV Lithography
Minyeop Kim, Hyeok Yun, Jiyoung Bang (Chonnam National University), Siwoo Noh, Geonhwa Kim, Ki-Jeong Kim (POSTECH), *Hyun-Dam Jeong (Chonnam National University)
PS6-10
Dill과 Mack 모델을 이용한 포토레지스트의 특성 측정에 관한 연구
박승태, 권해혁, *박종락 (조선대학교)